Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.58-66, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Engineered nanostructural films and materials : 22-23 July 1999, Denver, Colorado. pp.235-240, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of biomedical imaging : reporters, dyes, and instrumentation : 26-28 January, San Jose, California. pp.136-139, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of biomedical imaging : reporters, dyes, and instrumentation : 26-28 January, San Jose, California. pp.130-135, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical diagnostics for fluids/heat/combustion and photomechanics for solids : 21-23 July 1999, Denver, Colorado. pp.89-100, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore. pp.436-440, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.638-641, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida. pp.10-21, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering