1.

Conference Proceedings

Conference Proceedings
Shen, D.H. ; Li,W. ; Nobe, K.
Pub. info.: Proceedings of the Second International Symposium on Corrosion and Reliability of Electronic Materials and Devices.  pp.74-85,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-1
2.

Conference Proceedings

Conference Proceedings
Wang,Q. ; He,L. ; Guo,Q. ; Li,W.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.339-343,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
3.

Conference Proceedings

Conference Proceedings
DiMarzio,C.A. ; Oktar,T. ; Li,W. ; Rappaport,C.M.
Pub. info.: Environmental monitoring and remediation technologies II : 20-22 September, 1999, Boston, Massachusetts.  pp.311-320,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3853
4.

Conference Proceedings

Conference Proceedings
Li,W. ; Su,X. ; Su,L. ; Xiang,L.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.125-130,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
5.

Conference Proceedings

Conference Proceedings
Du,Y.F. ; He,Z. ; Knoll,G.F. ; Wehe,D.K. ; Li,W.
Pub. info.: Hard X-ray, gamma-ray, and neutron detector physics : 19-23 July 1999, Denver, Colorado.  pp.226-238,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3768
6.

Conference Proceedings

Conference Proceedings
Han,J. ; Hock,K.M. ; Li,W. ; Chong,T.C. ; Shintani,K. ; Tong,K.L. ; Huang,C.-H. ; Rayaraj,R.
Pub. info.: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  pp.279-281,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3864
7.

Conference Proceedings

Conference Proceedings
Ma,T. ; Xu,J. ; Wang,L. ; Huang,X. ; Du,J. ; Li,W. ; Chen,K.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.446-450,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
8.

Conference Proceedings

Conference Proceedings
Xing,X. ; Zhai,C. ; Du,H. ; Li,W. ; Hu,H. ; Wang,R. ; Shi,D.
Pub. info.: Advanced Technology Optical.  pp.839-849,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3352
9.

Conference Proceedings

Conference Proceedings
Cao,Z. ; Sang,N. ; Li,W. ; Wang,Y. ; Wang,G. ; Zhang,T.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.807-813,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
10.

Conference Proceedings

Conference Proceedings
McKnight,S.W. ; DiMarzio,C.A. ; Li,W. ; Hogenboom,D.O. ; Sauermann,G.O.
Pub. info.: Detection and remediation technologies for mines and minelike targets III : 13-17 April 1998, Orlando, Florida.  Part 2  pp.841-847,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3392