1.

Conference Proceedings
Conference Proceedings
1. Defect and Composition Analysis of as-deposited and Nitrided (100)Si/SiO2/Hf1-xSiO2 Stacks byElectron Paramagnectic Resonance and Ion Beam Analysis
von Bardeleben, H. J. ; Cantin, J. L. ; Ganem, J. J. ; Trimaille, I. ; Gusev, E. P.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.249-263,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. Electrical and Physical Behavior of SiC Layers on Insulator (SiCOI)
Hugonnard-Bruyere, E. ; Letertre, F. ; Cioccio, L. Di ; Bardeleben, H. J. von ; Cantin, J. L. ; Ouisse, T. ; Billon, T. ; Guillot, G.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.715-718,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
3.

Conference Proceedings
Conference Proceedings
3. Modification of the Oxide/Semiconductor Interface by High Temperature NO Treatments: A Combined EPR, NRA and XPS Study on Oxidized Porous and Bulk n-Type 4H-SiC
Bardeleben, H. J. von ; Cantin, J. L. ; Vickridge, I. ; Song, Y. ; Dhar, S. ; Feldman, L. C. ; Williams, J. R. ; Ke, L. ; Shishkin, Y. ; Devaty, R. P. ; Choyke, W. J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.277-282,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
4.

Conference Proceedings
Conference Proceedings
4. RBS-Channeling and EPR Studies of Damage in 2 MeV Al2+_Implanted 6H-SiC Substrates
Morilla, Y. ; Garcia Lopez, J. ; Battistig, G. ; Cantin, J. L. ; Cheang-Wong, J. C. ; Bardeleben, H. J. von ; Respaldiza, M. A.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.291-294,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
5.

Conference Proceedings
Conference Proceedings
5. Interface Defects in n-Type 3C-SiC/SiO2: An EPR Study of Oxidized Porous Silicon Carbide Single Crystals
Bardeleben, H. J. von ; Cantin, J. L. ; Ke, L. ; Shishkin, Y. ; Devaty, R. P. ; Choyke, W. J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.273-276,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485