Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.340-348, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.357-365, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Watson,C. ; Singh,N.B. ; Thomas,A. ; Nelson,A. E. ; Rolin,T. O. ; Griffin,J. ; Haulenbeek,G. ; Daniel,N. ; Seaquist,J. ; Cacioppo,C. ; Weber,J. ; Zugrav,M. I. ; Naumann,R. J.
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Materials research in low gravity : 28-29 July 1997, San Diego, California. pp.22-33, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.39-50, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.51-61, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.605-610, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.307-312, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.301-306, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.241-246, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1009-1014, 1997. Zurich, Switzerland. Trans Tech Publications