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11 results

Conference Proceedings

1. Fast inspection of radius,wall thickness,eccentricity,and ovality at the end of high-precision tubes:TRUDE 60-28 in production

Kleuver,W. ; Weber,J. ; Justen,D. ; Hartmann,K.

Pub. info.:	Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.340-348, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3100

Conference Proceedings

2. Surface inspection of transparent materials with a compact reflection sensor

Koscheck,M. ; Kleuver,W. ; Weber,J. ; Hartmann,K.

Pub. info.:	Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.357-365, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3100

Conference Proceedings

3. Processing of mercurous chloride in space

Watson,C. ; Singh,N.B. ; Thomas,A. ; Nelson,A. E. ; Rolin,T. O. ; Griffin,J. ; Haulenbeek,G. ; Daniel,N. ; Seaquist,J. ; Cacioppo,C. ; Weber,J. ; Zugrav,M. I. ; Naumann,R. J.

Pub. info.:	Materials research in low gravity : 28-29 July 1997, San Diego, California. pp.22-33, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3123

Conference Proceedings

4. Flexible calibration method for an image-guided 3D laser radar scanner applicable for large volumina

Weber,J.

Pub. info.:	Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.39-50, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3100

Conference Proceedings

5. Multisensor system for surface inspection and 3D geometry assessment

Becker,M. ; Weber,J. ; Schubert,E.

Pub. info.:	Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.51-61, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3100

Conference Proceedings

6. Photoluminescence centres associated with noble-gas impurities in silicon

Estreicher,S.K. ; Weber,J.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.605-610, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

7. Palladium-hydrogen related complexes in silicon

Sachse,J.-U. ; Weber,J. ; Lemke,H.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.307-312, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

8. Electrically active silver-hydrogen compiexes in silicon

Yarykin,N. ; Sachse,J.-U. ; Weber,J. ; Lemke,H.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.301-306, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

9. Formatiou and structure of hydrogen molecules iu crystalline Si

Leitch,A.W.R. ; Alex,V. ; Weber,J.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.241-246, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

10.

Conference Proceedings

10. EL2 induced enhancement of donor-acceptor pair luminescence In GaAs

Alex,V. ; Weber,J.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1009-1014, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

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