1.

Conference Proceedings

Conference Proceedings
Wang,Q. ; He,L. ; Guo,Q. ; Li,W.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.339-343,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
2.

Conference Proceedings

Conference Proceedings
Cheng,J. ; Qi,K. ; Wang,Q. ; Wan,J.
Pub. info.: Display devices and systems II : 16-17 September 1998, Beijing, China.  pp.227-232,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3560
3.

Conference Proceedings

Conference Proceedings
Liu,B. ; Fan,J. ; Yang,L. ; Wang,Q.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.9-14,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
4.

Conference Proceedings

Conference Proceedings
Wang,Q. ; Chang,J. ; Jiang,J. ; Liu,X.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.105-109,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
5.

Conference Proceedings

Conference Proceedings
Zhou,J. ; He,Z. ; Wang,Q.
Pub. info.: Multispectral imaging for terrestrial applications : 8-9 August 1996, Denver, Colorado.  pp.205-209,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2818
6.

Conference Proceedings

Conference Proceedings
Lei,H. ; Ou,H. ; Yang,Q. ; Hu,X. ; Wang,Q.
Pub. info.: Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore.  pp.594-601,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3896
7.

Conference Proceedings

Conference Proceedings
Wang,Y. ; Wang,Q. ; An,C. ; Su,B.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.210-213,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
8.

Conference Proceedings

Conference Proceedings
DeJesus,S.T. ; Desousa,B.A. ; Londhe,S. ; Wang,Q.
Pub. info.: Optical online industrial process monitoring : 22 September 1999, Boston, Massachusetts.  pp.40-52,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3859
9.

Conference Proceedings

Conference Proceedings
Benedict,G.F. ; McArthur,B. ; Nelan,E.P. ; Jefferys,W.H. ; Franz,O.G. ; Wasserman,L.H. ; Story,D.B. ; Shelus,P.J. ; Whipple,A.L. ; Bradley,A.J. ; Duncombe,R.L. ; Wang,Q. ; Hemenway,P.D. ; van Altena,W.F. ; Fredrick,L.W.
Pub. info.: Astronomical Interferometry : 20-24 March 1998, Kona, Hawaii.  Part 1  pp.229-236,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3350
10.

Conference Proceedings

Conference Proceedings
Zhao,J. ; Wang,Q. ; Fang,J.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.618-622,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379