1.

Conference Proceedings

Conference Proceedings
Bobkowski,R. ; Li,Y. ; Fedosejevs,R. ; Broughton,J.N.
Pub. info.: Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing VI : 11-13 March 1996, Santa Clara, California.  pp.393-401,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2723
2.

Conference Proceedings

Conference Proceedings
Montano,P.A. ; Li,Y. ; Ruett,U. ; Beno,M A. ; Jennings,G. ; Kimball,C.W.
Pub. info.: X-ray optics design, performance, and applications : 20-21 July 1999, Denver, Colorado.  pp.262-274,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3773
3.

Conference Proceedings

Conference Proceedings
Ai,J. ; Li,Y. ; Wang,T.
Pub. info.: Optoelectronic interconnects VI : 27-29 January 1999, San Jose, California.  pp.262-267,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3632
4.

Conference Proceedings

Conference Proceedings
Eliashevich,I. ; Li,Y. ; Osinsky,A. ; Tran,C.A. ; Brown,M.G. ; Karlicek,R.F.,Jr.
Pub. info.: Light-emitting diodes : research, manufacturing, and applications III : 27-28 January 1999, San Jose, California.  pp.28-36,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3621
5.

Conference Proceedings

Conference Proceedings
Li,Y. ; Ghantasala,M.K. ; Galatsis,K. ; Wlodarski,W.
Pub. info.: Device and process technologies for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia.  pp.364-371,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3892
6.

Conference Proceedings

Conference Proceedings
Huang,J. ; Yang,K. ; Xie,Z. ; Li,C. ; Zhao,Y. ; Liu,S. ; Wang,Y. ; Wu,F. ; Li,Y. ; Shen,J.
Pub. info.: Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore.  pp.570-575,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3896
7.

Conference Proceedings

Conference Proceedings
Popelek,J. ; Ai,J. ; Li,Y.
Pub. info.: Algorithms, devices, and systems for optical information processing III : 20-21 July 1999, Denver, Colorado.  pp.35-41,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3804
8.

Conference Proceedings

Conference Proceedings
Zeng,Q. ; Hu,W. ; Chen,J. ; Ye,A. ; Chen,Y. ; Zhou,Y. ; Wu,K. ; Li,Y. ; Xiong,Y. ; Jin,Y. ; Han,Y. ; Xu,Z. ; Li,S. ; Chen,Y.
Pub. info.: Fiber optic components and optical communication II : 18-19 September, 1998, Beijing, China.  pp.348-352,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3552
9.

Conference Proceedings

Conference Proceedings
Zhang,Y. ; Deng,Z. ; Han,Y. ; Li,Y. ; Zhang,S.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.118-124,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
10.

Conference Proceedings

Conference Proceedings
Li,Y. ; Yi,X. ; Hao,J.
Pub. info.: Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China.  pp.132-137,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3553