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32 results

Conference Proceedings

1. Effects of Ethanolamines on CdX (X = S, Se) Photoelectrochemistry

Minoura, H. ; Hibi, N. ; Sugieura, T. ; Yoshida, T. ; Kobayashi, H.

Pub. info.:	Proceedings of the Symposium on Photoelectrochemistry. pp.199-208, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-20

Conference Proceedings

2. Process Integration Trends for Embedded DRAM

Takato, H. ; Koike, H. ; Yoshida, T. ; Ishiuchi, H.

Pub. info.:	ULSI process integration : proceedings of the first international symposium. pp.107-122, 1999. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	99-18

Conference Proceedings

3. La0.5Sr0.5MnO3-YSZ composite film electrodes prepared by metal-organic decomposition for SOFC

Hayashi, K. ; Yoshida, T. ; Hosakawa, M. ; Ohya, Y. ; Takahashi, Y. ; Yamamoto, O. ; Minoura, Hideki

Pub. info.:	Proceedings of the Third International Symposium on Ionic and Mixed Conducting Ceramics. pp.700-707, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-24

Conference Proceedings

4. Chemical Bath Deposition of Band-Gap Tailored Indium Sulfide Thin Films

Yoshida, T. ; Yamaguchi, K. ; Toyoda, H. ; Akao, K. ; Sugiura, T. ; Minoura, H.

Pub. info.:	Proceedings of the Symposium on Photoelectrochemistry. pp.37-57, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-20

Conference Proceedings

5. AN ULTRASENSITIVE METHOD TO REVEAL DEFECTS THAT DEGRADE THE LOCALIZED RECOMBINATION LIFETIME OF THE NEAR SURFACE REGION OF BULK Si AND THIN EPILAYERS

Higgs, V. ; Chin, F. ; Wang, X. ; Kitagawara, Y. ; Yoshida, T.

Pub. info.:	Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology. pp.1564-1575, 1998. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-1(2)

Conference Proceedings

6. In-situ B Doping of Sii-xGex Film Epitaxially Grown on Si Using Ultraclean LPCVD

Honma, F. ; Murota, J. ; Yoshida, T. ; Goto, K. ; Maeda, T. ; Aizawa, K. ; Sawada, Y.

Pub. info.:	Proceedings of the Twelfth International Symposium on Chemical Vapor Deposition. pp.171-177, 1993. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1993-2

Conference Proceedings

7. The Performance and Reliability of 20cm Square Planar SOFC

Someya, Y. ; Koide, H. ; Ando, M. ; Yoshida, T.

Pub. info.:	Proceedings of the Fourth International Symposium on Solid Oxide Fuel Cells (SOFC-IV). pp.86-93, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	95-1

Conference Proceedings

8. STRUCTURE OF THE Ti-SINGLE CRYSTAL Si INTERFACE

Ogawa, S. ; Kouzaki, T. ; Yoshida, T. ; Sinclair, R.

Pub. info.:	Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A.. pp.139-144, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	181

Conference Proceedings

9. Bulk Lifetime Decreasing Phenomena Induced by Light-Illumination in High-Purity P-Type Cz-Si Crystals

Yoshida, T. ; Kitagawara, Y.

Pub. info.:	Proceedings of the Fourth International Symposium on High Purity Silicon. pp.450-454, 1996. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	96-13

10.

Conference Proceedings

10. Capability of Reliable Bulk Lifetime Evaluation in High-Purity Si by a Photoconductive Decay Measurement with a Chemical Passivation Technique

Yoshida, T. ; Kitagawara, Y.

Pub. info.:	Proceedings of the Fourth International Symposium on High Purity Silicon. pp.455-461, 1996. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	96-13

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