1.

Conference Proceedings

Conference Proceedings
Yu, J. ; Zhang, G. ; Li, P. ; Qin, K. ; Yang, H.
Pub. info.: Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China.  pp.64191Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6419
2.

Conference Proceedings

Conference Proceedings
Yu, X. ; Shao, Q. ; Zhu, Y. ; Deng, Y. ; Yang, H.
Pub. info.: Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China.  pp.64210D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6421
3.

Technical Paper

Technical Paper
Wright, L.M. ; ao, Z. ; Yang, H. ; Han, J-C.
Pub. info.: A.S.M.E. paper.  2006.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : GT
Ser. no.: 2006
4.

Technical Paper

Technical Paper
Yang, H. ; Chen, H-C. ; Han, J-C.
Pub. info.: A.S.M.E. paper.  2006.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : GT
Ser. no.: 2006
5.

Conference Proceedings

Conference Proceedings
Li, X. ; Yang, H. ; Wu, L. ; Song, Y.
Pub. info.: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.615054-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6150
6.

Conference Proceedings

Conference Proceedings
Chang, J. ; Wang, Y. ; Zhang, T. ; Talha, M. M. ; Weng, Z. ; Yang, H.
Pub. info.: International Optical Design Conference 2006.  pp.63421Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6342
7.

Conference Proceedings

Conference Proceedings
Park, C. ; Lee, J. ; Yang, K. ; Tseng, S. ; Min, Y.-H ; Yang, H. ; Yim, D. ; Kim, J.
Pub. info.: Optical Microlithography XIX.  pp.61540F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
8.

Conference Proceedings

Conference Proceedings
Kim, B. ; Kim, S. ; Kwon, Y. ; Lee, Y. ; Yang, H. ; Rhee, H.
Pub. info.: Interferometry XIII: Techniques and Analysis.  pp.629219-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6292
9.

Conference Proceedings

Conference Proceedings
Yang, H. ; Choi, J. ; Cho, B ; Hong, J. ; Song, J. ; Yim, D. ; Kim, J. ; Yamamoto. M.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.615232-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
10.

Conference Proceedings

Conference Proceedings
Hong, J. ; Lee, J. ; Kang, E. ; Yang, H. ; Yim, D. ; Kim, J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61522N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152