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19 results

Conference Proceedings

1. Knowledge-based geographic model integration

H. Yang ; G. Lu ; J. Wang ; Y. Hu ; Y. Yang ; Y. Wen

Pub. info.:	Geoinformatics 2007, Geospatial information technology and applications : 25-27 May 2007, Nanjing, China. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6754

Conference Proceedings

2. A metadata-based method for modeling geospatial objects

Y. Wang ; Y. Wen ; G. Lu

Pub. info.:	Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.64200I-1-64200I-6, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6420

Conference Proceedings

3. Study on data mining technology in hyperspectral remote sensing

H. Su ; Y. Sheng ; Y. Wen ; H. Tao

Pub. info.:	Geoinformatics 2007, Remotely sensed data and information : 25-27 May 2007, Nanjing, China. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6752

Conference Proceedings

4. Experimental PALSAR Interferometry in Shanghai for Ground Subsidence Monitoring

J. Wu ; C. Xu ; Y. Wen ; F. Xiao

Pub. info.:	Proceedings of the ALOS PI 2008 Symposium, 3-7 November 2008, Island of Rhodes, Greece. 2009. Noordwijk, The Netherlands. ESA Communication Production Office
Title of ser.:	ESA SP
Ser. no.:	664

Conference Proceedings

5. Arable land spatial pattern analysis along the middle-lower of Dongjiang River, China

Z. Lv ; Y. Wen ; Z. Wu ; H. Chen ; J. Zhang

Pub. info.:	Geoinformatics 2008 and Joint Conference on GIS and Built Environment: Monitoring and Assessment of Natural Resources and Environments. 1 pp.71450X-1-71450X-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7145

Conference Proceedings

6. Optimizing integrated optical CD monitoring by floating pre-process variations in a complex multi-layer structure

M. Strobl ; L. Huang ; A. Li ; Y. Luo ; Y. Wen

Pub. info.:	Lithography Asia 2008. 1 pp.71400G-1-71400G-12, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7140

Conference Proceedings

7. Characterization of the detector subsystem for the near-infrared spectrograph (NIRSpec) on the James Webb Space Telescope

D. B. Mott ; A. Waczynski ; Y. Wen ; B. J. Rauscher ; N. Boehm

Pub. info.:	High energy, optical, and infrared detectors for astronomy III. pp.702127-1-702127-12, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7021

Conference Proceedings

8. The ⁵⁵Fe x-ray energy response of mercury cadmium telluride near-infrared detector arrays

O. Fox ; A. Waczynski ; Y. Wen ; R. D. Foltz ; R. J. Hill

Pub. info.:	High energy, optical, and infrared detectors for astronomy III. pp.702123-1-702123-12, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7021

Conference Proceedings

9. Suspension system design study for a tuning fork vibratory MEMS gyroscope

Y. Wen ; A. Wang ; T. Jiang ; Z. Liu ; G. Liu

Pub. info.:	Fourth International Symposium on Precision Mechanical Measurements. 1 pp.71300J-1-71300J-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7130

10.

Conference Proceedings

10. Development of bock-end-of-the-line applications using optical digital profilometry (ODP)

J.-J. Huang ; J. H. Yeh ; Y. Luo ; L. Wu ; Y. Wen

Pub. info.:	Metrology, inspection, and process control for microlithography XXII. 2 pp.69223K-1-69223K-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6922

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