1.

Conference Proceedings

Conference Proceedings
Liu,B. ; Wu,X. ; Nie,K.
Pub. info.: Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China.  pp.211-215,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4554
2.

Conference Proceedings

Conference Proceedings
Zhang,Q. ; Toyooka,S. ; Wu,X.
Pub. info.: Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China.  pp.69-75,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4537
3.

Conference Proceedings

Conference Proceedings
Wu,X. ; Danaher,T. ; Wallace,J.F. ; Campbell,N.A.
Pub. info.: Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China.  pp.109-113,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4548
4.

Conference Proceedings

Conference Proceedings
Zhang,Z. ; Kim,I.S. ; Wang,J. ; Feng,H. ; Guo,N. ; Yu,X. ; Liu,H. ; Wu,X. ; Oh,S. ; Kim,Y.
Pub. info.: Sensors, systems, and next-generation satellites V : 17-20 September 2001, Toulouse, France.  pp.386-390,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4540
5.

Conference Proceedings

Conference Proceedings
Deshpande,S. ; Shao,X. ; III,J.E.Lamb ; Brakensiek,N. ; Johnson,J. ; Wu,X. ; Xu,G. ; Simmons,B.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.797-805,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
6.

Conference Proceedings

Conference Proceedings
Wu,X. ; Liu,X. ; Zhou,Y. ; Tao,D. ; He,X. ; Teng,Q.
Pub. info.: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.114-117,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4224
7.

Conference Proceedings

Conference Proceedings
Teng,Q. ; He,X. ; Jiang,L. ; Deng,Z. ; Wu,X. ; Tao,D.
Pub. info.: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.109-113,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4224
8.

Conference Proceedings

Conference Proceedings
Zhang,Z. ; Wang,J. ; Feng,H. ; Guo,N. ; Yu,X. ; Wu,X. ; Kim,I.S. ; Kim,Y.
Pub. info.: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.245-249,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4220
9.

Conference Proceedings

Conference Proceedings
Zhang,Z. ; Wang,J. ; Feng,H. ; Guo,N. ; Yu,X. ; Wu,X. ; Kim,I.S. ; Kim,Y.
Pub. info.: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.250-254,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4220
10.

Conference Proceedings

Conference Proceedings
Vertes,A. ; Bencsura,A. ; Sadeghi,M. ; Wu,X.
Pub. info.: Laser plasma generation and diagnostics : 27 January 2000, San Jose, California.  pp.76-84,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3935