Hill, T.A., Jones, A., Choularton, T.W.
Kluwer Academic Publishers
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Joncs,S.K., Allmed,M., Bazley,D.J., Beanlan,R.J., Wolf,I.De, Hill,C., Rothwell,W.J.
SPIE - The International Society for Optical Engineering
|
Maguluri, G., Sui, L., Roy, R.A., Murray, T.W.
SPIE - The International Society of Optical Engineering
|
Tomich, David H., Eyink, K.G., Haas, T.W., Capano, M.A., Kaspi, R., Cooley, W.T.
Materials Research Society
|
Parker, M.A., Sigmon, T.W., Sinclair, R.
Materials Research Society
|
Hiller,K., Hahn,R., Kaufmann,C., Kurth,S., Kehr,K., Gessner,T., Dotzel,W., Wiemer,M., Schubert,I.
SPIE - The International Society for Optical Engineering
|
Choularton, T.W., Hill, T.A.
Kluwer Academic Publishers
|
Jacobsen, C.J.H., Schmidt, I., Brorson, M., Boisen, A., Hansen, T.W., Dahl, S.
Trans Tech Publications
|
Bossy, E., Sui, L., Murray, T.W., Roy, R.A.
SPIE - The International Society of Optical Engineering
|
Staley, T.W., Matyi, R.J.
Materials Research Society
|
Abe, T., Tokai, K., Yamaguchi, Y., Nishikawa, O., Iyoda, T.
SPIE-The International Society for Optical Engineering
|
Hsieh,I., Sigmon,T.W.
SPIE-The International Society for Optical Engineering
|