1.

Conference Proceedings
Conference Proceedings
1. Kinetics of In-H and Cd-H complexes in silicon
Gebhard,M. ; Vogt,B. ; Witthuhn,W.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.15-20,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings
Conference Proceedings
2. Iron-,Manganese- and Chromium-Indium Pairs in Silicon
Reislohner,U. ; Schwarz,S. ; Witthuhn,W.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.147-152,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
3.

Conference Proceedings
Conference Proceedings
3. Radiotracer Identification of Ti,V and Cr Band Gap States in 4H- and 6H-SiC
Achtziger,N. ; Grillenberger,J. ; Witthuhn,W.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.541-544,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
4.

Conference Proceedings
Conference Proceedings
4. Acceptor-Hydrogen Complexes in InAs
Forkel-Wirth,D. ; Achtziger,N. ; Burchard,A. ; Correia,J.C. ; Deicher,M. ; Grillenberger,J. ; Gottschalck,H. ; Licht,T. ; Magerle,R. ; Reisldhner,U. ; Rub,M. ; Toulemonde,M. ; Witthuhn,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.963-968,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Structure and stability of cadmium-defect complexes in III-V-compounds formed after H2 plasma treatment
Baurichter,A. ; Deicher,M. ; Deubler,S. ; Forkel,D. ; Meier,J. ; Witthuhn,W.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.593-598,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87