1.

Conference Proceedings

Conference Proceedings
Wilson, M. ; Nandy, P. ; Post, B. ; Smith, J. ; Wehlburg, J.
Pub. info.: Earth observing systems X : 31 July-1 August 2005, San Diego, California, USA.  pp.58820I-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5882
2.

Conference Proceedings

Conference Proceedings
Akash, A. ; Nair, B. ; Minnick, K. ; Wilson, M. ; Hartvigsen, J.
Pub. info.: Continuous nanophase and nanostructured materials : symposium held December 1-5, 2003, Boston, Masachusetts, U.S.A..  pp.359-364,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 788
3.

Conference Proceedings

Conference Proceedings
Genkova, I. ; Wilson, M. ; Yang, Y. ; Zhao, G. ; Chapman, B. ; Snodgrass, E. ; Mazzoni, D. ; Di Girolamo, L.
Pub. info.: Remote sensing of clouds and the atmosphere X : 19-21 September 2005, Bruges, Belgium.  pp.59790B-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5979
4.

Conference Proceedings

Conference Proceedings
McEwen, R. K. ; Lupton, M. ; Lawrence, M. ; Knowles, P. ; Wilson, M. ; Dennis, P. N. J. ; Gordon, N. T. ; Lees, D. J. ; Parsons, J. F.
Pub. info.: Electro-optical and infrared systems : technology and applications III : 13-14 September 2006, Stockholm, Sweden.  pp.63950G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6395
5.

Conference Proceedings

Conference Proceedings
Wilson, M. ; Lagowski, J. ; Savtchou, A. ; Marinskiy, D. ; Jastrzebski, L. ; D'Amico, J.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.345-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
6.

Conference Proceedings

Conference Proceedings
Marinskiy, D. ; Lagowski, J. ; Wilson, M. ; Savtchouk, A. ; Jastrzebski, L. ; DeBusk, D.
Pub. info.: Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.225-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 591
7.

Conference Proceedings

Conference Proceedings
Wilson, M. ; Coulter, P. ; Hammer, J. A. ; Borek, G. T.
Pub. info.: Window and dome technologies and materials IX : 28-29 March 2005, Orlando, Florida, USA.  pp.335-348,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5786
8.

Conference Proceedings

Conference Proceedings
Wilson, M. ; Crouse, R.F. ; Ehrbach, P.S. ; Reiner, P.
Pub. info.: Window and come technologies VIII : 22-23 April 2003, Orlando, Florida, USA.  pp.18-27,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5078
9.

Conference Proceedings

Conference Proceedings
Busick, D. ; Wilson, M.
Pub. info.: New materials for batteries and fuel cells : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.247-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 575
10.

Conference Proceedings

Conference Proceedings
Ibey, B. ; Subramanian, H. ; Ericson, N. ; Xu, W. ; Wilson, M. ; Cote', G.L.
Pub. info.: Optical Diagnostics and Sensing V.  pp.54-60,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5702