1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF THIN-FILM BESOI USING A CVD Si1x-y-Gex-By ETCH STOP
Desmond, C.A. ; Hunt, C.E. ; Wetteroth, T.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.432-442,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10
2.

Conference Proceedings
Conference Proceedings
2. Requirements for TFSOI materials and their effects on devices from a user's perspective
Wilson, S.R. ; Hwang, B.Y. ; Foerstner, J. ; Wetteroth, T. ; Racanelli, M. ; Tsao, J. ; Huang, M.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.413-424,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11