Bulk defects and radiation damage in detector grade Silicon

Bulk defects and radiation damage in detector grade Silicon

Author(s):

Walter, J.

Publication title:

Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

302

Pub. Year:

1993

Page(from):

515

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558991989 [1558991980]

Language:

English

Call no.:

M23500/302

Type:

Conference Proceedings

Details

TDL ID:	ZA00017068
Series ID:	PA00000011
Conf. info. (Name):	Symposium on semiconductors for room-temperature radiation detector applications
Conf. info. (Number):	1993
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1993.04.12-1993.04.16

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