1.

Conference Proceedings
Conference Proceedings
1. Characterization of Structural Quality of Bonded Silicon-on-Insulator Wafers by Spectroscopic Ellipsometry and Raman Spectroscopy
Nguyen, N.V. ; Maslar, J.E. ; Kim, Jin-Yong ; Han, Jin-Ping ; Park, Jin-Won ; Chandler-Horowitz, D. ; Vogel, E.M.
Pub. info.: High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.127-132,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 809
2.

Conference Proceedings
Conference Proceedings
2. Physical Mechanisms of Ultra-Thin Silicon Dioxide Degradation and Breakdown
Vogel, E.M.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.279-292,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01