1.

Conference Proceedings
Conference Proceedings
1. DISPLACEMENT OF ARSENIC FROM SUBSTITUTIONAL SITES IN SILICON BY MeV He+ IRRADIATION
Varker, C. J. ; Wilson, S. R. ; Chan, S. S. ; Whitfield, J. D. ; Krause, S. J
Pub. info.: Ion beam processes in advanced electronic materials and device technology : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.123-136,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 45
2.

Conference Proceedings
Conference Proceedings
2. TRANSIENT ANNEALING OF BORON IMPLANTED DEVICES
Wilson, S. R. ; Paulson, W. M. ; Varker, C. J. ; Lowe, A. ; Gregory, R. B. ; Reuss, R. H. ; Wu, S. Y. ; Whitfield, J. D.
Pub. info.: Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.279-284,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 23
3.

Conference Proceedings
Conference Proceedings
3. OXYGEN PRECIPITATION IN SILICON - ITS EFFECTS ON MINORITY CARRIER RECOMBINATION AND GENERATION LIFETIME
Varker, C. J. ; Whitfield, J. C. ; Fejes, P. L.
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.187-194,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14
4.

Conference Proceedings
Conference Proceedings
4. DEEP LEVELS ASSOCIATED WITH OXYGEN PRECIPITATION IN CZ SILICON AND CORRELATION WITH MINORITY CARRIER LIFETIMES
Chan, S.S. ; Varker, C. J. ; Whitfield, J. ; Carpenter, R. W.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.281-286,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46