1.

Conference Proceedings
Conference Proceedings
1. Crack depth determination in concrete by ultrasound diffusion
Ramamoorthy, S.K. ; Kane, Y. ; Turner, J.A.
Pub. info.: Smart structures and materials 2003 : Smart systems and nondestructive evaluation for civil infrastructures : 3-6 March 2003, San Diego, California, USA.  pp.551-558,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5057
2.

Conference Proceedings
Conference Proceedings
2. Finite element simulations of nonlinear vibrations of atomic force microscope cantilevers
Shen, K. ; Turner, J.A.
Pub. info.: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.93-104,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4703
3.

Conference Proceedings
Conference Proceedings
3. Scattering of ultrasound in damaged concrete
Yang, L. ; Turner, J.A.
Pub. info.: Smart Nondestructive Evaluation for Health Monitoring of Structural and Biological Systems.  pp.231-240,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4702
4.

Conference Proceedings
Conference Proceedings
4. Quantitative elastic-property information with acoustic AFM: measurements and modeling
Hurley, D.C. ; Wiehn, J.S. ; Turner, J.A. ; Rice, P.
Pub. info.: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.65-73,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4703
5.

Conference Proceedings
Conference Proceedings
5. Nonlinear vibrations in atomic force microscopy
Turner, J.A.
Pub. info.: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.74-84,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4703