Blank Cover Image

PtSi, gimbal-based, FLIR for airborne applications

Author(s):
Wallace, J. ( Israel Aircraft Industries Ltd. )
Ornstein, I. ( Israel Aircraft Industries Ltd. )
Nezri, M. ( Israel Aircraft Industries Ltd. )
Fryd, Y. ( Israel Aircraft Industries Ltd. )
Bloomberg, S. ( Israel Aircraft Industries Ltd. )
Beem, S. ( Israel Aircraft Industries Ltd. )
Bibi, B. ( Israel Aircraft Industries Ltd. )
Hem, S. ( Israel Aircraft Industries Ltd. )
Perna, S. ( Sarnoff Corporation )
Tower, J. ( Sarnoff Corporation )
Lang, F. ( Sarnoff Corporation )
Villani, T. ( Sarnoff Corporation )
McCarthy, D.R. ( Sarnoff Corporation )
Stabile, P. ( Sarnoff Corporation )
9 more
Publication title:
Infrared technology and applications XXIII : 20-25 April, 1997, Orlando, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3061
Pub. Year:
1997
Vol.:
Part 1
Page(from):
159
Page(to):
167
Pub. info.:
Bellingham, Wash.: SPIE
ISSN:
0277786X
ISBN:
9780819424761 [0819424765]
Language:
English
Call no.:
P63600/3061
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings 640。゚480 PtSi infrared engine

Lang,F.B., Coyle,P.J., Stabile,P.J., Tower,J.R., Zubalsky,I., Ornstein,I.

SPIE-The International Society for Optical Engineering

7 Conference Proceedings Stray radiation in ariborne FLIR system

Schwartz, R., Bloomberg, S., Moin, M., Layosh, Y.Z.

SPIE-The International Society for Optical Engineering

Villani,T.S., Loesser,K.A., Perna,S.N., McCarthy,D.R., Pantuso,F.P.

SPIE-The International Society for Optical Engineering

8 Conference Proceedings Shape-memory actuated gimbal

B.F. Carpenter, R.J. Head, R. Gehling

Society of Photo-optical Instrumentation Engineers

Ru, G-P., Detavernier, C., Donaton, R. A., Blondeel, A., Clauws, P., Meirhaeghe, R. L. Van, Cardon, F., Maex, K., Qu, …

MRS - Materials Research Society

Moyer, S.K., Flug, E., Edwards, T.C., Krapels, K.A., Scarbrough, J.

SPIE - The International Society of Optical Engineering

4 Conference Proceedings BEEM and UHV-TEM Studies of PtSi/Si(001)

Kavanagh, K. L., Morgan, B. A., Talin, A. A., Ring, K. M., Williams, R. S., Reuter, M. C., Tromp, R. M.

MRS - Materials Research Society

S. Perna, C. Wimmer, J. Moreira, G. Fornaro

ESA Communication Production Office

Huston,D.R., Spillman,W.B.,Jr., Drzewiczewski,S., Eid,B.F.

SPIE-The International Society for Optical Engineering

Dowling,J.A., Kelly,B.T., Gonglewski,J.D., Fox,M.J., Shilko,M.L., Higdon,N.S., Highland,R.G., Senft,D.C., Dean,D.R., …

SPIE-The International Society for Optical Engineering

T. Peli, D. Widder, S.J. Plante, P.T. Monsen, L.F. Bennett

Society of Photo-optical Instrumentation Engineers

Gambino, J. P., Cunningham, B., Turene, F. E., Shepard, J. F.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12