1.

Conference Proceedings
Conference Proceedings
1. *Chemical vapor deposition and electrode technologies for (Ba,Sr) TiO3 capacitor used in gigabit DRAM
Eguchi, K. ; Hieda, K. ; Nakahira, J. ; Kiyotoshi, M. ; Nakabayashi, M. ; Yamazaki, S. ; Izuha, M. ; Aoyama, T. ; Tsunoda, K. ; Lin, J. ; Nakamura, K. ; Niwa, S. ; Tomita, H. ; Shimada, A. ; Kohyama, Y. ; Ishibashi, Y. ; Fukuzumi, Y. ; Arikado, T. ; Okumura, K.
Pub. info.: Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.3-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 596
2.

Conference Proceedings
Conference Proceedings
2. Development of novel radiation remote-sensing method based on laser spectroscopic measurement of radiation-induced radicals
Tomita, H. ; Watanabe, K. ; Kawarabayashi, J. ; Iguchi, T.
Pub. info.: Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California.  pp.281-288,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5198
3.

Technical Paper
Technical Paper
3. Online Four-Dimensional Flight Trajectory Search and its Flight Testing
Suzuki, S. ; Komatsu, Y. ; Yonezawa, S. ; Masui, K. ; Tomita, H.
Pub. info.: AIAA meeting papers on disc.  2005.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Guidance Navigation and Control Conference
Ser. no.: 2005
4.

Conference Proceedings
Conference Proceedings
4. Automated observatory for multicolor active galactic nuclei monitoring (MAGNUM)
Kobayashi, Y. ; Yoshii, Y. ; Minezaki, T. ; Enya, K. ; Aoki, T. ; Suganuma, M. ; Tomita, H. ; Doi, M. ; Motohara, K. ; Peterson, B.A. ; Smith, C.H. ; Little, J.K. ; Greene, B.
Pub. info.: Large Ground-based Telescopes.  Part Two  pp.954-964,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4837
5.

Conference Proceedings
Conference Proceedings
5. Barometric pressure compensation to control photoresist film thickness
Vishnu, V. ; Randall, M. ; Pillette, C.J. ; Katayama, K. ; Omura, K. ; Uemura, R. ; Tomita, H. ; Ando, R. ; Ogata, K. ; Maejima, H. ; DiDonato, A. ; Nicholson, J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.958-966,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375