1.
Conference Proceedings
Oliver,A.D. ; Tanner,D.M. ; Mani,S.S. ; Swanson,S.E. ; Helgesen,K.S. ; Smith,N.F.
Pub. info.:
Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA . pp.242-253, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4558
2.
Conference Proceedings
Walraven,J.A. ; Soden,J.M. ; Tanner,D.M. ; Tangyunyong,P. ; Cole Jr.,E.I. ; Anderson,R.E. ; Irwin,L.W.
Pub. info.:
MEMS Reliability for Critical Applications . pp.30-39, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4180
3.
Conference Proceedings
Walraven,J.A. ; Mani,S.S. ; Fleming,J.G. ; Headley,T.J. ; Kotula,P.G. ; Pimentel,A.A. ; Rye,M.J. ; Tanner,D.M. ; Smith,N.F.
Pub. info.:
MEMS Reliability for Critical Applications . pp.49-57, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4180