1.

Conference Proceedings

Conference Proceedings
Tanaka,S. ; Sato,H.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.474-477,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
2.

Conference Proceedings

Conference Proceedings
Tanaka,S. ; Fukushima,N. ; Matsushita,J. ; Akatsu,T. ; Niihara,K. ; Yasuda,E.
Pub. info.: Smart materials.  pp.346-354,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4234
3.

Conference Proceedings

Conference Proceedings
Fukushima,N. ; Gomi,T. ; Tanaka,S. ; Matsushita,J.
Pub. info.: Smart materials.  pp.355-363,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4234
4.

Conference Proceedings

Conference Proceedings
Irie,N. ; Muramatsu,K. ; Ishii,Y. ; Magome,N. ; Umatate,T. ; Kyoh,S. ; Tanaka,S. ; Inoue,S. ; Higashikawa,I. ; Mori,I. ; Okumura,K.
Pub. info.: 20th Annual BACUS Symposium on Photomask Technology.  pp.34-45,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4186
5.

Conference Proceedings

Conference Proceedings
Irie,N. ; Muramatsu,K. ; Ishii,Y. ; Magome,N. ; Umatate,T. ; Kyoh,S. ; Tanaka,S. ; Inoue,S. ; Higashikawa,I. ; Mori,I. ; Okumura,K.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology VII.  pp.641-648,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4066
6.

Conference Proceedings

Conference Proceedings
Kyoh,S. ; Tanaka,S. ; Inoue,S. ; Higashikawa,I. ; Mori,I. ; Okumura,K. ; Irie,N. ; Muramatsu,K. ; Ishii,Y. ; Magome,N. ; Umatate,T.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology VII.  pp.631-640,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4066
7.

Conference Proceedings

Conference Proceedings
Kyoh,S. ; Tanaka,S. ; Inoue,S. ; Higashikawa,I. ; Mori,I. ; Okumura,K. ; Irie,N. ; Muramatsu,K. ; Ishii,Y. ; Magome,N. ; Umatate,T.
Pub. info.: 20th Annual BACUS Symposium on Photomask Technology.  pp.494-502,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4186
8.

Conference Proceedings

Conference Proceedings
Matsunaga,T. ; Enami,T. ; Kakizaki,K. ; Saito,T. ; Tanaka,S. ; Nakarai,H. ; Inoue,T. ; Igarashi,T.
Pub. info.: Optical Microlithography XIV.  4346  pp.1617-1626,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4346
9.

Conference Proceedings

Conference Proceedings
Ohmori,R. ; Tanaka,S. ; Watanabe,A. ; Hayakawa,S. ; Sato,H.
Pub. info.: Optoelectronic Information Systems and Processing.  pp.147-152,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4513
10.

Conference Proceedings

Conference Proceedings
Tanaka,S. ; Sato,H.
Pub. info.: Optoelectronic Information Systems and Processing.  pp.153-158,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4513