The Effect of Pressure on Carrier Scattering in Semiconductors

The Effect of Pressure on Carrier Scattering in Semiconductors

Author(s):

Publication title:

Collective phenomena and transport properties

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

22(1)

Pub. Year:

1984

Page(from):

317

Page(to):

320

Pages:

4

Pub. info.:

New York: North-Holland

ISSN:

02729172

ISBN:

9780444009296 [0444009299]

Language:

English

Call no.:

M23500/22-1

Type:

Conference Proceedings

Details

TDL ID:	ZA00015515
Series ID:	PA00000011
Conf. info. (Name):	AIRAPT International High Pressure Conference
Conf. info. (Number):	9th
Conf. info. (Venue):	Albany, New York, USA
Conf. info. (Date):	1983.07.24-1983.07.29

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