1.

Conference Proceedings
Conference Proceedings
1. Fourier Transform Infrared Spectroscopy for InAsSb/GaSb Type II Superlattice
Juang, F.S. ; Su, Y.K. ; Chen, S.M.
Pub. info.: Proceedings of the Third International Symposium on long wavelength infrared detectors and arrays : physics and applications III.  pp.167-174,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-28
2.

Conference Proceedings
Conference Proceedings
2. Normal Incidence Intersubband and Interband Optical Transitions in GaSb/InAs Superlattices
Su, Y.K. ; Chen, S.M. ; Yu, C.F.
Pub. info.: Proceedings of the Third International Symposium on long wavelength infrared detectors and arrays : physics and applications III.  pp.151-157,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-28
3.

Conference Proceedings
Conference Proceedings
3. MgCdTe Far Infrared Photodiodes
Su, Y.K. ; Juang, F.S.
Pub. info.: Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors.  pp.97-109,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-2
4.

Conference Proceedings
Conference Proceedings
4. THE GROWTH MECHANISMS OF GaSb EPITAXIAL FILM BY MOCVD
Ueng, H.Y. ; Chen, S.M. ; Su, Y.K. ; Juang, F.S.
Pub. info.: Long-wavelength semiconductor devices, materials, and processes : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.265-268,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 216
5.

Conference Proceedings
Conference Proceedings
5. Study of S102/lnP Structure Prepared by Direct Photo-CVD
Shei, S.C. ; Su, Y.K. ; Hwang, C.J. ; Yokoyama, M.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.137-148,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1