1.

Conference Proceedings
Conference Proceedings
1. SUBSTRATE AND PARTICLE DEPENDENT DEEP LEVEL GENERATION IN SILICON BY MeV PARTICLE BEAMS
Trauwaert, M.-A. ; Vanhellemont, J. ; Simoen, E. ; Claeys, C. ; Johlander, B. ; Harboe-Sorensen, R. ; Adams, L. ; Clauws, P.
Pub. info.: Beam-solid interactions : fundamentals and applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.93-98,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 279
2.

Conference Proceedings
Conference Proceedings
2. Noise as a Spectroscopic Tool for Semiconductor Characterization
Clacys, C. ; Simoen, E.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.324-341,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12
3.

Conference Proceedings
Conference Proceedings
3. Degradation and recovery of alpha ray irradiated MOSFETs on SIMOX
Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Kawamura, K. ; Hakata, T. ; Sunaga, H. ; Ogita, Y.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.289-294,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
4.

Conference Proceedings
Conference Proceedings
4. ON THE ELECTRICAL ACTIVITY OF OXYGEN-RELATED EXTENDED DEFECTS IN SILICON
Vanhellemont, J. ; Simoen, E. ; Bosman, G. ; Claeys, C. ; Kaniava, A. ; Gaubas, E. ; Blondeel, A. ; Clauws, P.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.670-683,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10
5.

Conference Proceedings
Conference Proceedings
5. Freeze-out Effects on the Characteristics of Deep Submicron Si MOSFETs in the 77 to 300 K Range
Croon, J. ; Biesemans, S. ; Kubicek, S. ; Simoen, E. ; De Meyer, K. ; Claeys, C.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.187-198,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2
6.

Conference Proceedings
Conference Proceedings
6. Impact Ionization Related Phenomena in Si MOSFETs Operated at Cryogenic Temperatures
Simoen, E. ; Claeys, C.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.117-139,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2
7.

Conference Proceedings
Conference Proceedings
7. Impact of the Generation Width on the Lifetime Extraction in Cz Siliconp-n Junction Diodes
Czerwinski, A. ; Simoen, E. ; Poyai, A. ; Claeys, C.
Pub. info.: Proceedings of the Third International Symposium on Defects in Silicon.  pp.88-99,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-1
8.

Conference Proceedings
Conference Proceedings
8. Simple Method to Extract the length Dependent Mobility Degradation Factor at 77 K
Nicolett, A.S. ; Martino, J.A. ; Simoen, E. ; Claeys, C.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.159-170,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2
9.

Conference Proceedings
Conference Proceedings
9. Thermal Oxygen Donors with an Anomalous Small Electron Capture Cross Section
Neimash, V.B. ; Siratskii, V.M. ; Kraichinskii, A.M. ; Puzenko, O.O. ; Claeys, C. ; Simoen, E.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.200-210,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
10.

Conference Proceedings
Conference Proceedings
10. OPTIMISED DIODE ASSESSMENT OF THE SURFACE AND BULK GENERATION/RECOMBINATION PROPERTIES OF SILICON SUBSTRATE
Simoen, E. ; Poyai, A. ; Claeys, C. ; Czerwinski, A. ; Katcki, J.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1576-1592,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)