1.

Conference Proceedings
Conference Proceedings
1. Epitaxial Layer Lifetime Characterization in the Frequency Domain
Park,J.E. ; Schroder,D.K. ; Tan,S.E. ; Choi,B.D. ; Fletcher,M. ; Buczkowski,A. ; Kirscht,F.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.383-395,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings
Conference Proceedings
2. Trends in Lifetime Measurements
Schroder,D.K.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.365-382,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218