1.

Conference Proceedings

Conference Proceedings
Park,J.-H. ; Seo,D.-C. ; Kim,K.-D. ; Park,S.-Y. ; Kim,S.-J. ; Lee,H. ; Jung,J.-C. ; Bok,C.-K. ; Baik,K.-H.
Pub. info.: Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California.  Part 1  pp.454-462,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3333
2.

Conference Proceedings

Conference Proceedings
Park,Y.-K. ; Ju,B.-K. ; Park,H.-W. ; Yoon,Y.-S. ; Yom,S.-S. ; Oh,Y.-J. ; Park,J.-H. ; Suh,S.-H. ; Oh,M.-H. ; Kim,C.-J.
Pub. info.: Device and process technologies for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia.  pp.356-363,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3892
3.

Conference Proceedings

Conference Proceedings
Wikantika,K. ; Tetuko,J. ; Wihartini,S.S. ; Tateishi,R. ; Park,J.-H. ; Agung,B.H.
Pub. info.: Earth observing systems IV : 18-20 July 1999, Denver, Colorado.  pp.186-194,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3750
4.

Conference Proceedings

Conference Proceedings
Park,H.-W. ; Ju,B.-K. ; Lee,Y.-H. ; Kang,I.-B. ; Samaan,N.D. ; Haskard,M.R. ; Park,J.-H. ; Oh,M.-H.
Pub. info.: Smart structures and materials 1997 : Smart electronics and MEMS : 4-6 March 1997, San Diego, California.  pp.328-335,  1997.  Bellingham.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3046
5.

Conference Proceedings

Conference Proceedings
Park,J.-H. ; Kim,S.-J. ; Park,S.-Y. ; Lee,H. ; Jung,J.-C. ; Bok,C.-K. ; Baik,K.-H.
Pub. info.: Advances in resist technology and processing XIV : 10-12 March 1997, Santa Clara, California.  pp.485-491,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3049
6.

Conference Proceedings

Conference Proceedings
Park,J.-H. ; Kim,Y.-H. ; Lim,S.-C. ; Lee,K.-H. ; Choi,S.-W. ; Yoon,H.-S. ; Sohn,J.-M.
Pub. info.: 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California.  Part2  pp.937-942,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3873
7.

Conference Proceedings

Conference Proceedings
Kim,S.-J. ; Park,J.-H. ; Kim,J.-H. ; Kim,K.-D. ; Lee,H. ; Jung,J.-C. ; Bok,C.-K. ; Baik,K.-H.
Pub. info.: Advances in resist technology and processing XIV : 10-12 March 1997, Santa Clara, California.  pp.430-436,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3049
8.

Conference Proceedings

Conference Proceedings
Park,J.-H. ; Kim,S.-J. ; Kim,J.-H. ; Seo,D.-C. ; Kim,K.-D. ; Park,S.-Y. ; Lee,H.
Pub. info.: Advances in resist technology and processing XIII : 11-13 March 1996, San Clara, California.  pp.287-295,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2724
9.

Conference Proceedings

Conference Proceedings
Kim,M.R. ; Park,J.-H. ; Jhe,W.
Pub. info.: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  Supplement  pp.446-448,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3864
10.

Conference Proceedings

Conference Proceedings
Kim,T.-G. ; Hwang,S.-M. ; Kim,S.-I. ; Son,C.-S. ; Kim,E.K. ; Min,S.-K. ; Park,J.-H. ; Park,K.-H.
Pub. info.: Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing VI : 11-13 March 1996, Santa Clara, California.  pp.63-67,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2723