A New Method of Diagnosing Simultaneous Multiple Faults via Neural Networks
- Author(s):
- Lee, S. ( Korea Advanced Institute of Science & Technology, Taejon, Korea )
- Park, S. ( Korea Advanced Institute of Science & Technology, Taejon, Korea )
- Himmelblau, D. ( University of Texas at Austin, Austin, TX )
- Publication title:
- AIChE ANNUAL MEETING - NOVEMBER 16-21, 1997 - LOS ANGELES, CA
- Title of ser.:
- AIChE meeting [papers]
- Ser. no.:
- 1997
- Pub. Year:
- 1997
- Paper no.:
- 215b
- Pages:
- 26
- Pub. info.:
- New York: American Institute of Chemical Engineers
- Language:
- English
- Call no.:
- A08000
- Type:
- Conference Proceedings
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