Litho variations and their impact on the electrical yield of a 32nm node 6T SRAM cell
- Author(s):
- S. Verhaegen ( IMEC vzw, Belgium )
- S. Cosemans ( ESAT-MICAS, KULeuven, Belgium )
- M. Dusa ( ASML B.V., Netherlands )
- P. Marchal ( IMEC vzw, Belgium )
- A. Nackaerts ( IMEC vzw, Belgium )
- Publication title:
- Design for manufacturability through design-process integration II : 28-29 February 2008, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6925
- Pub. Year:
- 2008
- Page(from):
- 69250R-1
- Page(to):
- 69250R-12
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819471109 [0819471100]
- Language:
- English
- Call no.:
- P63600/6925
- Type:
- Conference Proceedings
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