1.

Conference Proceedings

Conference Proceedings
Chen, C. Y. ; Kimura, S. ; Sen, S. ; Nozaki, S. ; Ono, H. ; Uchida, K. ; Morisaki, H.
Pub. info.: Group-IV semiconductor nanostructures : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A..  pp.249-256,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 832
2.

Conference Proceedings

Conference Proceedings
Si, Junjie ; Ono, H. ; Uchida, K. ; Nozaki, S. ; Morisaki, H.
Pub. info.: Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 638
3.

Conference Proceedings

Conference Proceedings
Sato, K. ; Izumi, T. ; Iwase, M. ; Show, Y. ; Nozaki, S. ; Morisaki, H.
Pub. info.: Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 638
4.

Conference Proceedings

Conference Proceedings
Nozaki, S. ; Chen, Y.-W. ; Nakao, Z. ; Shiraga, H.
Pub. info.: Image processing : algorithms and systems : 21-23 January 2002, San Jose, USA.  pp.303-311,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4667
5.

Technical Paper

Technical Paper
Sato, Y. ; Nozaki, S. ; Noda, T.
Pub. info.: 2004 International Fuels and Lubricants Meeting : SAE technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
6.

Conference Proceedings

Conference Proceedings
Schwitzgebel, J. ; Xiao, G. ; Bockwell, B. ; Nozaki, S. ; Darvish, A. ; Wu, C.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61523H-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152