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Group-IV semiconductor nanostructures : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A.. pp.249-256, 2005. Warrendale, Pa.. Materials Research Society
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Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, PA.. Materials Research Society
Sato, K. ; Izumi, T. ; Iwase, M. ; Show, Y. ; Nozaki, S. ; Morisaki, H.
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Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, PA.. Materials Research Society
Nozaki, S. ; Chen, Y.-W. ; Nakao, Z. ; Shiraga, H.
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Image processing : algorithms and systems : 21-23 January 2002, San Jose, USA. pp.303-311, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Metrology, Inspection, and Process Control for Microlithography XX. pp.61523H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering