Bremond, G. ; Guillot, G. ; Nouailhat, A. ; Picoli, G.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.371-376, 1985. Pittsburgh, Pa.. Materials Research Society
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.509-514, 1988. Pittsburgh, Pa.. Materials Research Society
Bremond, G. ; Nouailhat, A. ; Guillot, G. ; Deveaud, B. ; Lambert, B. ; Toudic, Y. ; Clerjaud, B. ; Naud, C.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.359-364, 1985. Pittsburgh, Pa.. Materials Research Society