1.

Conference Proceedings

Conference Proceedings
Kudrawiec,R. ; Bryja,L. ; Misiewicz,J. ; Paszkiewicz,R. ; Korbutowicz,R. ; Panek,M. ; Paszkiewicz,H. ; Tlaczala,M.J.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.37-40,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings

Conference Proceedings
Bryja,L. ; Ryczko,K. ; Kubisa,M. ; Misiewicz,J. ; Stern,O. ; Bayer,M. ; Forchel,A.W.B. ; Sorensen,C.B.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.16-20,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
3.

Conference Proceedings

Conference Proceedings
Nowaczyk-Utko,M. ; Sek,G. ; Misiewicz,J. ; Sciana,B. ; Radziewicz,D. ; Tlaczala,M.J.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.254-257,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
4.

Conference Proceedings

Conference Proceedings
Sek,G. ; Ryczko,K. ; Misiewicz,J. ; Bayer,M. ; Klopf,F. ; Reithmaier,J.P. ; Forchel,A.W.B.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.139-142,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413