1.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Wagner,Mt. ; Dirnstorfer,I. ; Hofmann,D.M. ; Karg,F.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1467-1472,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Leib,U. ; Hofstaetter,A. ; Krummel,C. ; Kohl,D.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1473-1478,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263