1.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Omling,P. ; Emanuelsson,P.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.397-398,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Stadler,W. ; Meyer,B.K. ; Hofmann,D.M. ; Kowalski,B. ; Emanuelsson,P. ; Omling,P. ; Weigl,E. ; Miiller-Vogt,G. ; Cox,R.T.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.399-404,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Emanueisson,P. ; Maximov,I. ; Linke,H. ; Omling,P. ; Samuelson,L. ; Meyer,B.K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1541-1546,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147