1.

Conference Proceedings
Conference Proceedings
1. *ENDOR SPECTROSCOPY ON DEEP LEVEL DEFECTS IN GaAs
Spaeth, J. -M. ; Gorger, A. ; Hofmann, D. M. ; Meyer, B. K.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.363-374,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
2.

Conference Proceedings
Conference Proceedings
2. *MICROSCOPIC IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS BY ELECTRON-SPIN-RESONANCE AND RELATED TECHNIQUES
Spaeth, J> M. ; Hofmann, D. M. ; Meyer, B. K.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.185-194,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46