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Temperature Dependence of Ag/Ni Multilayer Microstructure Studied by In Situ X-ray Diffraction

Author(s):
Chenevler, B.
Delabouglise, Q.
Ghetta, V.
LaManna, J.
Matko, I.
Senateur, J. P.
Sstrom, P.
Sundgren, J-E.
3 more
Publication title:
Polycrystalline metal and magnetic thin films : symposium held April 5-8, 1999, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
562
Pub. Year:
1999
Page(from):
195
Page(to):
200
Pages:
6
Pub. info.:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558994690 [1558994696]
Language:
English
Call no.:
M23500/562
Type:
Conference Proceedings

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