1.

Conference Proceedings
Conference Proceedings
1. Simple Method to Extract the length Dependent Mobility Degradation Factor at 77 K
Nicolett, A.S. ; Martino, J.A. ; Simoen, E. ; Claeys, C.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.159-170,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2
2.

Conference Proceedings
Conference Proceedings
2. A new method for determination of the fixed charge density at the buried oxide/underlying substrate interface in SOI MOSFETs
Pavanello, M.A. ; Martino, J.A.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.162-167,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
3.

Conference Proceedings
Conference Proceedings
3. Theoretical and Experimental Study of the Front and Back Interface Trap Density in Accumulation-Mode SOI MOSFETs
Martino, J.A. ; Simoen, E. ; Claeys, C.
Pub. info.: Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.271-277,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-9
4.

Conference Proceedings
Conference Proceedings
4. Combined ΔL and Series Resistance Extraction of LDD MOSFETs at 77 K
Schreutelkamp, R. ; Martino, J.A. ; Simoen, E. ; Deferm, L. ; Ciaeys, C.
Pub. info.: Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.290-296,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-9