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DETECTION OF MISFIT STRAIN RELAXATION IN MBE GROWN Si1-XGe FILMS BY DYNAMIC MONITORING OF RHEED DIFFRACTION FEATURES

Author(s):
Maes, J. W.
Schannen, O. F. Z.
Trommel, J.
Werner, K.
Radelaar, S.
Balk, P.
1 more
Publication title:
Mechanisms of Heteroepitaxial growth : symposium held April 27-30, 1992, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
263
Pub. Year:
1992
Page(from):
427
Page(to):
432
Pages:
6
Pub. info.:
Pittsburgh, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558991583 [1558991581]
Language:
English
Call no.:
M23500/263
Type:
Conference Proceedings

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