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CoSi2/Si1-xGex interfaces for Schottky barrier infrared detectors with extended detection regime

Author(s):
Publication title:
Growth and characterization of materials for infrared detectors II : 13-14 July, 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2554
Pub. Year:
1995
Page(from):
175
Page(to):
184
Pages:
10
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419132 [0819419133]
Language:
English
Call no.:
P63600/2554
Type:
Conference Proceedings

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