1.

Conference Proceedings
Conference Proceedings
1. Formation and Annihilation of Epitaxial Stacking Faults Generated from Pre-Existing Nucleation Sites in Silicon
Cho,C.R. ; Noh,K.Y. ; Lee,D.H. ; Kim,Y.S. ; Ko,S.W. ; Kim,C.W. ; Kim,D.H. ; Son,C.B. ; Kim,S.J. ; Cho,D.H. ; Choi,J.J. ; Kim,D.J. ; Bae,K.M. ; Rozgonyi,G.A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.201-208,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Technical Paper
Technical Paper
2. Measurement and Modeling of Combustion in a Microcombustor
Lee,D.H. ; Choi,K.H. ; Kwon,S.
Pub. info.: AIAA paper.  pp.1-8,  2001.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Thermophysics Conference
Ser. no.: 2001
3.

Conference Proceedings
Conference Proceedings
3. Defects analysis of mask blanks
Lee,D.H. ; Kim,D.W. ; Lee,J.K. ; Jeong,W.G. ; Choi,S.-S. ; Jung,S.-M. ; Jeong,S.-H.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.571-576,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562
4.

Conference Proceedings
Conference Proceedings
4. Evaluation of reticle cleaning performance with different drying methods for high-grade photomasks
Jeong,W.G. ; Lee,S.W. ; Kim,D.H. ; Yoon,Y.J. ; Lee,D.H. ; Choi,B.Y. ; Choi,S.-S. ; Jung,S.M. ; Jeong,S.-H.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.99-110,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562