1.

Conference Proceedings
Conference Proceedings
1. Effect of Cryogenic Temperature Deposition of Various Metal Contacts to Bulk, Single-Crystal n-type ZnO
Jon Wright ; L. Stafford ; B. P. Gila ; D. P. Norton ; S. J. Pearton ; Hung-Ta Wang ; F. Ren
Pub. info.: Zinc oxide and related materials : symposium held November 27-30, 2006, Boston, Massachusetts, U.S.A..  pp.143-148,  2007.  Warrrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 957
2.

Conference Proceedings
Conference Proceedings
2. Development of Thin Film and Nanorod ZnO-Based LEDs and Sensors
S. J. Pearton ; L. C. Tien ; H. S. Kim ; D. P. Norton ; J. J. Chen ; H. T. Wang ; B. S. Kang ; F. Ren ; W. T. Lim ; J. Wright ; R. Khanna ; L. F. Voss ; L. Stafford ; J. Jun ; Jenshan. Lin
Pub. info.: Zinc oxide and related materials : symposium held November 27-30, 2006, Boston, Massachusetts, U.S.A..  pp.3-14,  2007.  Warrrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 957
3.

Conference Proceedings
Conference Proceedings
3. In-situ Surface Recombination Measurement of Oxygen and Chlorine Atoms on Dynamic Stainless Steel Surfaces in Inductively Coupled O2 and Cl2 Plasmas
L. Stafford ; R. Khare ; J. Guha ; V.M. Donnelly
Pub. info.: Plasma Processing 17.  pp.23-32,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 13(8)
4.

Conference Proceedings
Conference Proceedings
4. Thermally Stable Novel Metal Contacts on Bulk, Single-Crystal n-type ZnO
J. Wright ; R. Khanna ; L. F. Voss ; L. Stafford ; B. Gila ; D. Norton ; S. Pearton ; F. Pen ; I. I. Kravchenko
Pub. info.: State-of-the-art program on compound semiconductors 46 (SOTAPOCS 46) and processes at the semiconductor/solution interface 2.  pp.279-284,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(2)
5.

Conference Proceedings
Conference Proceedings
5. Nitride-based Ohmic and Schottky Contacts to GaN
L. F. Voss ; L. Stafford ; J. Wright ; B. Gila ; C. R. Abernathy ; S. Pearton ; F. Pen ; I. I. Kravchenko
Pub. info.: State-of-the-art program on compound semiconductors 46 (SOTAPOCS 46) and processes at the semiconductor/solution interface 2.  pp.191-200,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(2)
6.

Conference Proceedings
Conference Proceedings
6. High Density Inductively Coupled Plasma Etching of Zinc-Oxide(ZnO) and Indium-Zinc Oxide(IZO)
W. Lim ; L. Stafford ; B. Gila ; D. Norton ; S. Pearton ; F. Ren ; J. Song ; J. Park ; Y. Heo ; J. Lee ; J. Kim
Pub. info.: State-of-the-art program on compound semiconductors 46 (SOTAPOCS 46) and processes at the semiconductor/solution interface 2.  pp.239-248,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(2)
7.

Conference Proceedings
Conference Proceedings
7. GaN-Based Devices for Reliable Operation at Very High Temperatures
A. M. Dabiran ; A. V. Osinsky ; P. P. Peter ; R. C. Fitch ; N. Moser ; A. Crespo ; T. J. Anderson ; F. Ren ; R. Khanna ; L. Stafford ; S. J. Pearton
Pub. info.: State-of-the-art program on compound semiconductors 45 (SOTAPOCS 45) and wide bandgap semiconductor materials and devices 7.  pp.349-358,  2006.  Pennington, N.J.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(5)
8.

Conference Proceedings
Conference Proceedings
8. Novel Thermally Stable Contacts to GaN
L. Stafford ; R. Khanna ; L. Voss ; S. J. Pearton ; F. Ren ; T. J. Anderson ; A. Dabiran ; A. Osinsky
Pub. info.: State-of-the-art program on compound semiconductors 45 (SOTAPOCS 45) and wide bandgap semiconductor materials and devices 7.  pp.341-348,  2006.  Pennington, N.J.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(5)
9.

Conference Proceedings
Conference Proceedings
9. High Temperature Stable Contacts for GaN HEMTs and LEDs
S. Pearton ; L. Voss ; R. Khanna ; L. Stafford ; F. Ren ; A. Dabiran ; A. Osinsky
Pub. info.: Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A..  pp.9-18,  2009.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1108