1.

Conference Proceedings

Conference Proceedings
Lanke, U.D. ; Koo, A. ; Ruck, B.J. ; Lee, H.K. ; Markwitz, A. ; Kennedy, V.J. ; Ariza, M.J. ; Jones, D.J. ; Roziere, J. ; Bittar, A. ; Trodahl, H.J.
Pub. info.: GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.347-352,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 693
2.

Conference Proceedings

Conference Proceedings
Koo, A. ; Lanke, U.D. ; Ruck, B.J. ; Brown, S.A. ; Reeves, R. ; Liem, I. ; Bittar, A. ; Trodahl, H.J.
Pub. info.: GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.621-628,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 693
3.

Conference Proceedings

Conference Proceedings
Walecki, W. J. ; Pravdivtsev, A. ; Lai, K. ; Santos II, M. ; Koo, A.
Pub. info.: Optical Diagnostics.  pp.58800H-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5880
4.

Conference Proceedings

Conference Proceedings
Walecki, W. J. ; Azfor, T. ; Pravdivstev, A. ; Santos II M ; Koo, A.
Pub. info.: Micromachining and Microfabrication Process Technology XI.  pp.61090J-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6109
5.

Conference Proceedings

Conference Proceedings
Walecki, W. J. ; Pradivstev, A. ; Santos II, M. ; Koo, A.
Pub. info.: Interferometry XIII: Techniques and Analysis.  pp.629211-629211,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6292
6.

Conference Proceedings

Conference Proceedings
Walecki, W. ; Wei, F. ; Van, P. ; Lai, K. ; Lee, T. ; Lau, S.H. ; Koo, A.
Pub. info.: Reliability, Testing, and Characterization of MEMS/MOEMS III.  pp.55-62,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5343
7.

Conference Proceedings

Conference Proceedings
Walecki, W. J. ; Azfar, T. ; Pravdivstev, A. ; SantosII, M. ; Wong, T. ; Feng, A. ; Koo, A.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V.  pp.61110M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6111
8.

Conference Proceedings

Conference Proceedings
Walecki, W.J. ; Lai, K. ; Pravdivtsev, A. ; Souchkov, V. ; Van, P. ; Azfar, T. ; Wong, T. ; Lau, S.H. ; Koo, A.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV.  pp.182-188,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5716