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GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.. pp.347-352, 2002. Warrendale, Pa.. Materials Research Society
Koo, A. ; Lanke, U.D. ; Ruck, B.J. ; Brown, S.A. ; Reeves, R. ; Liem, I. ; Bittar, A. ; Trodahl, H.J.
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GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.. pp.621-628, 2002. Warrendale, Pa.. Materials Research Society
Walecki, W. J. ; Azfor, T. ; Pravdivstev, A. ; Santos II M ; Koo, A.
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Micromachining and Microfabrication Process Technology XI. pp.61090J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Walecki, W. ; Wei, F. ; Van, P. ; Lai, K. ; Lee, T. ; Lau, S.H. ; Koo, A.
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Reliability, Testing, and Characterization of MEMS/MOEMS III. pp.55-62, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Walecki, W. J. ; Azfar, T. ; Pravdivstev, A. ; SantosII, M. ; Wong, T. ; Feng, A. ; Koo, A.
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V. pp.61110M-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Walecki, W.J. ; Lai, K. ; Pravdivtsev, A. ; Souchkov, V. ; Van, P. ; Azfar, T. ; Wong, T. ; Lau, S.H. ; Koo, A.
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. pp.182-188, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering