1.

Conference Proceedings
Conference Proceedings
1. MEMS technologies for rf communications
Wu,Q. ; Liu,X. ; Kim,B.
Pub. info.: MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK.  pp.267-274,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4407
2.

Conference Proceedings
Conference Proceedings
2. Novel concept of TDI readout circuit for LWIR detector
Kim,B. ; Yoon,N. ; Lee,H.C. ; Kim,C.-K.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.166-172,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
3.

Conference Proceedings
Conference Proceedings
3. Effects of alignment accuracy on CMP process for overlay control
Hong,J. ; Joung,G. ; Yang,H. ; Park,J. ; Kim,J. ; Kim,B.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.441-448,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
4.

Technical Paper
Technical Paper
4. Estimation of Aircraft Lateral-Directional Aerodynamic Derivatives from Flying Quality Flight Test
Lee,K. ; Kim,B. ; Park,K. ; Kang,J.
Pub. info.: A collection of technical papers, AIAA Atmospheric Flight Mechanics Conference, Montreal, Canada, 6-9 August 2001.  pp.115-120,  2001.  Reston VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Atmospheric Flight Mechanics Conference
Ser. no.: 2001
5.

Conference Proceedings
Conference Proceedings
5. Emergence of assist feature OPC era in sub-130-nm DRAM devices
Kim,B. ; Kim,I. ; Yeo,G. ; Lee,J. ; Choi,J. ; Cho,H. ; Moon,J.
Pub. info.: 20th Annual BACUS Symposium on Photomask Technology.  pp.452-459,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4186