1.

Conference Proceedings
Conference Proceedings
1. Characterization of High-K Dielectrics Using the Non-Contact Surface Charge Profiler (SCP) Method
Roman, P. ; Lee, D. ; Mumbauer, P. ; Grant, R. ; Kamieniecki, E. ; Ruzyllo, J.
Pub. info.: Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium.  pp.187-192,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-5
2.

Conference Proceedings
Conference Proceedings
2. Feasibility of surface photovoltage based characterization of ultra-thin SOI wafers
Lukasiak, L. ; Kamieniecki, E. ; Jakubowski, A. ; Ruzyllo, J.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.425-430,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5