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40 results

Conference Proceedings

1. CORRELATION OF DISLOCATION LOOP FORMATION AND TIME DEPENDENT DIFFUSION OF IMPLANTED P-TYPE DOPANTS IN GALLIUM ARSENIDE

Robinson, H. G. ; Deal, M. D. ; Steveson, D. A. ; Jones, K. S.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.715-720, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

2. RAPID GROWTH KINETICS, MECHANICAL PROPERTIES AND THERMAL STABILITY OF SiOδ THIN FILMS GROWN BY RAPID THERMAL LOW PRESSURE CHEMICAL VAPOR DEPOSITION

Feingold, A. ; Katz, A. ; Pearton, S. J. ; Chakrabati, U. K. ; Jones, K. S.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.425-430, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

3. *ION IMPLANTATION RELATED DEFECTS IN GaAs

Jones, K. S. ; Bollong, M. ; Haynes, T. E. ; Deal, M. D. ; Allen, E. L. ; Robinson, H. G.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.785-796, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

4. POINT DEFECT DETECTOR STUDIES OF OXIDIZED SILICON

Meng, H. L. ; Jones, K. S. ; Prussin, S.

Pub. info.:	Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.101-106, 1992. Pittsburgh. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	238

Conference Proceedings

5. SOLID PHASE EPITAXIAL REGROWTH OF IMPLANTATION AMORPHIZED Si0.7Ge0.3 GROWN ON (100) SILICON

Lee, C. ; Jones, K. S.

Pub. info.:	Phase formation and modification by beam-solid interactions : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.. pp.57-64, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	235

Conference Proceedings

6. STRAIN RELIEF AND DEFECT FORMATION IN HIGH DOSE OXYGEN IMPLANTED SILICON

Venables, D. ; Jones, K. S. ; Namavar, F. ; Manke, J. M.

Pub. info.:	Phase formation and modification by beam-solid interactions : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.. pp.103-108, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	235

Conference Proceedings

7. CHARACTERIZATION OF ION IMPLANTED ZnSe/GaAs UPON RAPID THERMAL ANNEALING

Lowen, P. D. ; Jones, K. S. ; Ochoa, R. ; Simmons, J. ; Wang, Y. H. ; Park, R. M. ; Wilson, R.

Pub. info.:	Rapid thermal and integrated processing : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.. pp.467-472, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	224

Conference Proceedings

8. POINT DEFECT DETECTOR STUDIES OF Ge + IMPLANTED SILICON UPON OXIDATION

Meng, H. L. ; Prussin, S. ; Jones, K. S.

Pub. info.:	Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.. pp.253-258, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	262

Conference Proceedings

9. Effect of Energy and Dose on Transient-Enhanced Diffusion and Defect Microstructure in Low-Energy-High-Dose As+-Implanted Si

Krishnamoorthy, V. ; Venables, D. ; Moeller, K. ; Jones, K. S. ; Freer, B.

Pub. info.:	Microstructure evolution during irradiation : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A.. pp.29-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	439

10.

Conference Proceedings

10. Modeling of Extended Defects in Silicon

Law, M. E. ; Jones, K. S. ; Earles, S. K. ; Lilak, A. D. ; Xu, J-W.

Pub. info.:	Microstructure evolution during irradiation : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A.. pp.3-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	439

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