Zhang, F. ; Ying, Y. ; Shen, C. ; Jiang, H. ; Zhang, Q.
Pub. info.:
Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.60000S-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63521P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wu, B. ; Bai, J. ; Tassev,, V. L. ; Lal Nakarmi M. ; Sun, W. ; Huang, X. ; Dudley, M. ; Zhang, H. ; Bliss, D. F. ; Lin, J. ; Jiang, H. ; Yang, J. ; Asif Kahn, M.
Pub. info.:
GaN, AlN, InN and related materials : symposium held November 28-December 2, 2005, Boston, Massachusetts, U.S.A.. pp.653-658, 2006. Warrendale, Pa.. Materials Research Society
Scalability and traffic control in IP networks II : 31 July-1 August, 2002, Boston, [Massachusetts], USA. pp.277-288, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Industrial and highway sensors technology : 28-30 October 2003, Providence, Rhode Island, USA. pp.263-272, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Biomedical diagnostic, guidance, and surgical-assist systems IV : 20-21 January 2002, San Jose, USA. pp.91-97, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ICO20: remote sensing and infrared devices and systems : 21-26 August 2005, Changchun, China. pp.603102-603102, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the Fourth International Symposium on Process Physics and Modeling in Semiconductor Technology. pp.24-33, 2004. Pennington, NJ. Electrochemical Society
Millimeter and submillimeter detectors for astronomy : 25-28 August 2002, Waikoloa, Hawaii, USA. pp.312-317, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3741-3744, 2005. Uetikon-Zuerich. Trans Tech Publications