1.

Conference Proceedings
Conference Proceedings
1. Investigation of Recombination Parameters in Ion Implanted Layer-Substrate Si Structures
Gaubas, E. ; Jarasiunas, K. ; Kaniava, A. ; Vaitkus, J.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.603-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
2.

Conference Proceedings
Conference Proceedings
2. Photodiffractive Characterization of Growth-Defects in GaAs
Jarasiunas, K. ; Sudzius, M. ; Kaniava, A. ; Vaitkus, J.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.59-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378