1.

Conference Proceedings
Conference Proceedings
1. Effect of Surface-Exchange Catalyst on the Transport Properties of MIEC Membrane for Hydrogen Separation
J. Hong ; H. Wang ; S. Gopalan ; U. Pal
Pub. info.: Hydrogen Production, Transport, and Storage 2.  pp.1-6,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(17)
2.

Conference Proceedings
Conference Proceedings
2. Zn-Air Fuel Cell/Battery Hybrid Power Sources with Addition of Borohydride
J. Hong ; B. Fang ; C. Wang ; K. Currie
Pub. info.: Metal/Air and Metal/Water Batteries.  pp.89-99,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(42)
3.

Conference Proceedings
Conference Proceedings
3. Copper Diffusion and Corrosion Behavior Through the Hillock Defect Found Beneath the Weak SiN Dielectric Barrier in Dual Damascene Process
S. Kim ; C. Shim ; J. Hong ; H. Lee ; J. Han ; K. Kim ; Y. Kim
Pub. info.: Dielectrics for nanosystems II: materials science, processing, reliability, and manufacturing.  pp.237-242,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(1)
4.

Conference Proceedings
Conference Proceedings
4. Room Temperature Ferromagnetism and Lack of Ferroelectricity in Thin Films of 'Biferroic' YbCrO₃
K.V. Rao ; Sandeep Nagar ; Lyubov M. Belova ; G. Catalan ; J. Hong ; James Scott ; A.K. Tyagi ; O.D. Jayakumar ; R. Shukla ; Yi Sheng ; Jinghua Guo
Pub. info.: Novel materials and devices for spintronics : symposium held April 14-17, 2009, San Francisco, California, U.S.A..  pp.163-168,  2009.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1183
5.

Technical Paper
Technical Paper
5. Thermal Management of the LED Headlamp Module for a Motorcycle
S. Lin ; J. Hong ; M. Tsai ; H. Shih ; J. Leong ; W. Chen
Pub. info.: AIAA meeting papers on disc.  2008.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Thermophysics Conference
Ser. no.: 2008
6.

Conference Proceedings
Conference Proceedings
6. Advanced process control with design-based metrology
H. Yang ; J. Kim ; J. Hong ; D. Yim ; T. Hasebe ; M. Yamamoto
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
7.

Conference Proceedings
Conference Proceedings
7. The optimization of photoresist profile for sub-90nm technology
H. Jeon ; C. Shim ; J. Hong ; J. Han ; K. Kim
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
8.

Conference Proceedings
Conference Proceedings
8. Photoresist adhesion effect of resist reflow process
J. Park ; J. Lee ; M. Kim ; J. Kim ; S. Lee ; J. Park ; C. Bok ; S. Moon ; S. Park ; J. Hong ; H. Oh
Pub. info.: Advances in resist materials and processing technology XXIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6519
9.

Conference Proceedings
Conference Proceedings
9. Advanced new OPC method to improve OPC accuracy for sub-90nm technology
J. Choi ; J. Kang ; Y. Shim ; K. Yun ; J. Hong ; Y. Lee ; K. Kim
Pub. info.: Optical microlithography XX.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6520
10.

Conference Proceedings
Conference Proceedings
10. Characteristics analysis of polarization module on optical proximity effect
C. Park ; J. Hong ; K. Yang ; T. Theeuwes ; F. Gautier ; Y. Min ; A. Chen ; H. Yang ; D. Yim ; J. Kim
Pub. info.: Optical microlithography XX.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6520