1.

Conference Proceedings
Conference Proceedings
1. Nanometer fluctuations of erythrocytes imaged by Hilbert phase microscopy [5864-11]
Popescu, G. ; Ikeda, T. ; Badizadegan, K. ; Dasari, R.R. ; Feld, M.S.
Pub. info.: Novel optical instrumentation for biomedical applications II : 12-16 June 2005, Munich, Germany.  pp.58640B-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5864
2.

Conference Proceedings
Conference Proceedings
2. Modeling of ferroelastic behavior of shape memory alloys
Ikeda, T.
Pub. info.: Smart structures and materials 2005 : Modeling, signal processing, and control : 7-9 March 2005, San Diego, California, USA.  pp.344-352,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5757
3.

Technical Paper
Technical Paper
3. Improvement of Transitional Characteristic by Measuring Pressure in the Combustion Chamber.
Ikeda, T. ; Nakajima, T. ; Kawai, D. ; Fukami, Y.
Pub. info.: 2005 Small Engine Technology Conference and Exhibition : SAE technical paper.  2005.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2005
4.

Conference Proceedings
Conference Proceedings
4. Mask pattern quality assurance based on lithography simulation with fine pixel SEM image [5992-59]
Kariya, M. ; Yamanaka, E. ; tanaka, S. ; Ikeda, T. ; Yamaguchi, S. ; Hashimoto, K. ; Itoh, M. ; Kobayashi, H. ; Kawashima, T. ; Narukawa, S.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.59921M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
5.

Conference Proceedings
Conference Proceedings
5. Simultaneous measurement of a profile shape and deformation of an object by processing projected pattern and texture pattern [5880-03]
Yoshizawa, T. ; Yamamoto, M. ; Ikeda, T.
Pub. info.: Optical Diagnostics.  pp.588003-588003,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5880
6.

Conference Proceedings
Conference Proceedings
6. Novel methodology of employing scatterometry to assess optical proximity correction test pattern
Asano, M. ; Koike, T. ; Mikami, T. ; Abe, H. ; Ikeda, T. ; Tanaka, S. ; Mimotogi, S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XIX.  pp.9-18,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5752
7.

Conference Proceedings
Conference Proceedings
7. Side-chain liquid-crystalline polymers containing oxadiazole and amine moleties for organic light-emitting diode (Invited Paper) [5936-12]
Kinoshita, M. ; Kawamoto, M. ; Mochizuki, H. ; Nam, Y. ; Ikeda, T.
Pub. info.: Liquid Crystals IX.  pp.59360C-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5936
8.

Conference Proceedings
Conference Proceedings
8. Photoinduced bending of polymer films (Invited Paper) [5947-16]
Ikeda, T. ; Maeda, T. ; Kondo, M. ; Yu, Y.
Pub. info.: Liquid Crystals: Optics and Applications.  pp.59470E-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5947
9.

Conference Proceedings
Conference Proceedings
9. Reticle SEM specifications required for lithography simulation [5853-36]
Kariya, M. ; Yamanaka, E. ; Tanaka, S. ; Ikeda, T. ; Yamaguchi, S. ; Itoh, M. ; Kobayashi, H. ; Kawashima, T. ; Narukawa, S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.550-555,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853