1.

Conference Proceedings
Conference Proceedings
1. Macroscopic constitutive model of shape memory alloys for partial transformation cycles
Ikeda, T. ; Nae, F.A. ; Matsuzaki, Y.
Pub. info.: Smart structures and materials 2004 : modeling, signal processing, and control : 15-18 March 2004, San Diego, California, USA.  pp.112-121,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5383
2.

Conference Proceedings
Conference Proceedings
2. Ultra-High-Speed and Low-Power SOI CMOS Technology with Body-Tied Hybrid Trench Isolation Structure
Hirano, Y. ; Ipposhi, T. ; Thai, D. H. ; Iwamatsu, T. ; Ikeda, T. ; Tsujiuchi, M. ; Maegawa, S. ; Inuishi, M. ; Ohji, Y.
Pub. info.: Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium.  pp.60-64,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-04
3.

Conference Proceedings
Conference Proceedings
3. Measurement and Analysis of Sound Absorption of Porous Magnesium
Xie, Z.K. ; Ikeda, T. ; Okuda, Y. ; Nakajima, H.
Pub. info.: Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003.  pp.661-664,  2004.  Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 449-452
4.

Conference Proceedings
Conference Proceedings
4. Structural Study of a High Ionic Conductor Rb4Cu16I7.2Cl12.8
Oikawa, K. ; Kamiyama, T. ; Kanno, R. ; Izumi, F. ; Ikeda, T. ; Chakoumakos, B.C.
Pub. info.: EPDIC 8 : proceedings of the eighth European Powder Diffraction Conference, held May 23-26, 2002 in Uppsala, Sweden.  pp.337-340,  2004.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 443-444
5.

Technical Paper
Technical Paper
5. Adsorption and Desorption Characteristics of the Adsorber to Control the HC Emission from a Gasoline Engine.
Mukai, K. ; Kanesaka, H. ; Akama, H. ; Ikeda, T.
Pub. info.: 2004 Powertrain and Fluid Systems Conference and Exhibition : SAE technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
6.

Conference Proceedings
Conference Proceedings
6. Dynamic holographic polymer dispersed liquid crystals (Invited Paper)
Urbas, A.M. ; Klosterman, J. ; Tondiglia, V. ; Natarajan, L.V. ; Sutherland, R.L. ; Tabirian, N. ; Ikeda, T. ; Bunning, T.J.
Pub. info.: Tuning the Optical Response of Photonic Bandgap Structures.  pp.18-25,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5511
7.

Conference Proceedings
Conference Proceedings
7. Liquid-crystalline elastomers with photomechanical properties (Invited Paper)
Yu, Y. ; Nakano, M. ; Ikeda, T.
Pub. info.: Liquid Crystals VIII.  pp.1-10,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5518
8.

Conference Proceedings
Conference Proceedings
8. Measurement precision of CD-SEM for 65-nm technology node
Abe, H. ; Motoki, H. ; Ikeda, T. ; Yamazaki, Y.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.929-939,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
9.

Conference Proceedings
Conference Proceedings
9. A photomask defect evaluation system
Yamanaka, E. ; Kanamitsu, S. ; Hirano, T. ; Tanaka, S. ; Ikeda, T. ; Ikenaga, O. ; Kawashima, T. ; Narukawa, S. ; Kobayashi, H.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XI.  pp.257-264,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5446
10.

Conference Proceedings
Conference Proceedings
10. Tolerance-based process proximity correction (PPC) verification methodology
Hashimoto, K. ; Fujise, H. ; Nojima, S. ; Ito, T. ; Ikeda, T.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XI.  pp.471-480,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5446